Design for Test (DFT)
From Memory To Momentum
Design | Verify | Deliver
Chip to system, Embedded to software, Training to talent, M-One makes it happen.
At M-One, our (DFT) solutions ensure higher yield, faster debugging, and dependable ICs with minimal performance and area overhead.
DFT
Our Design for Test services allow all integrated circuits to be tested in a complete and efficient manner once they are manufactured. We design for testability so that faults can be detected more quickly, are easier to debug and are cheaper to produce.
Our technologies range from scan insertion and built-in self-test (BIST) to boundary scan and test pattern generation to apply proven methodologies to maximise fault coverage and minimise overhead on performance and area. By designing strong test plans at the design stage, we aid in achieving greater yield, reduced time to market and more dependable products in the field.
Scan Insertion
Strategic placement of scan chains for comprehensive fault detection and diagnosis.
- Complete Coverage
- Fast Detection
- Easy Debug
Built-in Self-Test (BIST)
Integrated self-testing capabilities reducing external test equipment dependency.
- Self-Contained Testing
- Cost Reduction
- Field Testing
Boundary Scan
IEEE 1149.1 compliant boundary scan for board-level testing and debugging.
- Board-Level Test
- In-System Programming
- Interconnect Testing
Test Pattern Generation
Automated generation of comprehensive test patterns for maximum fault coverage.
- Maximum Coverage
- Pattern Optimization
- Minimal Overhead
Greater Yield
Strong test plans implemented at design stage result in higher manufacturing yield rates.
Reduced Time to Market
Efficient testing strategies accelerate product development and deployment timelines.
Dependable Products
Comprehensive testing ensures reliable field performance and customer satisfaction.